Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-22T19:31:17.187Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution In Situ and Transmission Environmental Electron Microscopy of Material Reactions

Published online by Cambridge University Press:  07 February 2019

Robert Sinclair ,
Yunzhi Liu ,
Sang Chul Lee  and
Ai Leen Koh
Robert Sinclair
Affiliation:
Department of Materials Science & Engineering, Stanford University, Stanford, CA 94305-4034, USA.
Yunzhi Liu
Affiliation:
Department of Materials Science & Engineering, Stanford University, Stanford, CA 94305-4034, USA.
Sang Chul Lee
Affiliation:
Department of Materials Science & Engineering, Stanford University, Stanford, CA 94305-4034, USA.
Ai Leen Koh
Affiliation:
Department of Materials Science & Engineering, Stanford University, Stanford, CA 94305-4034, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Keynote Speech
Information
Microscopy and Microanalysis , Volume 25 , Issue S1: Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy , February 2019 , pp. 3 - 4
Copyright
Copyright © Microscopy Society of America 2019 

References

References:

[1]Sinclair, R, Mats Res Soc Bull 38 (2013) p.1065.Google Scholar
[2]Butler, EP and Hale, KF in “Practical Methods in Electron Microscopy”, ed. Glauert, AM, (North- Holland Pub Com, New York) Vol. 9.Google Scholar
[3]Sinclair, R et al. , Acta Crystallogr Sec A 44 (1988), p. 965.Google Scholar
[4]Konno, TJ and Sinclair, R, Philos Mag B 71 (1995), p. 179.Google Scholar
[5]Min, KH et al. , Philos Mag 85 (2005), p. 2049.Google Scholar
[6]Koh, AL et al. , in “Controlled Atmosphere Transmission Electron Microscopy - Principles and Practice”, ed. Hansen, TW and Wagner, JB, (Springer Publishing Company, New York), p. 3.Google Scholar
[7]Ko, DH and Sinclair, R, Ultramicroscopy 54 (1994), p. 166.Google Scholar
[8]Koh, AL et al. , ACS Nano 7(3) (2013), p. 2566.Google Scholar
[9]Lee, SC et al. , ACS Nano 10 (2016), p. 624.Google Scholar
[10]Sinclair, R et al. , Ultramicroscopy 176 (2017), p. 200.Google Scholar
[11]Koh, AL et al. , Nano Lett 16(2) (2016), p. 856.Google Scholar
[12]Koh, AL and Sinclair, R, Ultramicroscopy 176 (2017), p. 132.Google Scholar
[13]Financial support from the CCNE-TD (NCI-NIH Grant # U54 CA151459) and Toyota Re- search Institute – Accelerated Materials Design and Discovery program (Stanford University) is much appreciated.Google Scholar