High Resolution EELS in the IBM Sub-Angstrom STEM

PE Batson

doi:10.1017/S1431927606066438

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High Resolution EELS in the IBM Sub-Angstrom STEM

Published online by Cambridge University Press: 31 July 2006

PE Batson

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PE Batson: Affiliation:
IBM Thomas J Watson Research Center

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type: Abstract
Information: Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1336 - 1337

DOI: https://doi.org/10.1017/S1431927606066438 [Opens in a new window]
Copyright: © 2006 Microscopy Society of America

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High Resolution EELS in the IBM Sub-Angstrom STEM

Volume 12, Issue S02
PE Batson ^(a1)
DOI: https://doi.org/10.1017/S1431927606066438

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High Resolution EELS in the IBM Sub-Angstrom STEM

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