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High Count Rate Standardless and Standard-Based Quantification in EDS – Practical Limits and Root Causes for Deviations in the Result

Published online by Cambridge University Press:  01 August 2010

S Scheller ,
T Salge  and
R Terborg
S Scheller
Affiliation:
Bruker AXS Microanalysis, Germany
T Salge
Affiliation:
Bruker AXS Microanalysis, Germany
R Terborg
Affiliation:
Bruker AXS Microanalysis, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1314 - 1315
Copyright
Copyright © Microscopy Society of America 2010