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Hard X-ray Resonant Ptychography for Chemical Imaging at the Sensitivity Limit

Published online by Cambridge University Press:  10 August 2018

Juliane Reinhardt ,
Andreas Schropp ,
Mikhail Lyubomirskiy ,
Martin Seyrich ,
Dennis Bruckner ,
Thomas F. Keller ,
Vedran Vonk ,
Sergey Volko ,
Andreas Stierle  and
Edvinas Navickas
...Show all authors
Juliane Reinhardt*
Affiliation:
Australian Synchrotron and La Trobe University, Dept. of Chemistry and Physics, Melbourne, Australia Australian Research Council, Centre of Excellence for Advanced Molecular Imaging, Australia
Andreas Schropp
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Mikhail Lyubomirskiy
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Martin Seyrich
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Dennis Bruckner
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Thomas F. Keller
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany University of Hamburg, Department Physik, Hamburg, Germany
Vedran Vonk
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Sergey Volko
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
Andreas Stierle
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany University of Hamburg, Department Physik, Hamburg, Germany
Edvinas Navickas
Affiliation:
Technical University Wien, Institute for Chemical Technologies and Analytics, Vienna, Austria
Jürgen. Fleig
Affiliation:
Technical University Wien, Institute for Chemical Technologies and Analytics, Vienna, Austria
Christian G. Schroer
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany University of Hamburg, Department Physik, Hamburg, Germany
*
*Corresponding author: [email protected]

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 26 - 27
Copyright
© Microscopy Society of America 2018 

References

[1] Schropp, A., et al., Appl. Phys. Lett. 100, 253112 2012.Google Scholar
[2] Hoppe, R., Reinhardt, J., et al., Appl. Phys. Lett. 102, 203104 2013.CrossRefGoogle Scholar
[3] Reinhardt, J., et al., Ultramicroscopy 173, 52–57, 2017.Google Scholar
[4] Reinhardt, J. Schroer, C.G. JINST 2018) accepted.Google Scholar
[5] Reinhardt, J. PhD thesis 2017.Google Scholar