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Hard X-ray In-situ Full-field Microscopy for Material Science Applications.

Published online by Cambridge University Press:  10 August 2018

Irina Snigireva ,
Ken Vidar Falch ,
Daniele Casari ,
Marco Di Michiel ,
Carsten Detlefs ,
Ragnvald Mathiesen  and
Anatoly Snigirev
Irina Snigireva*
Affiliation:
European Synchrotron Radiation Facility, 38000Grenoble, France
Ken Vidar Falch
Affiliation:
Department of Physics, Norwegian University of Science and Technology, 7491 Trondheim, Norway
Daniele Casari
Affiliation:
Department of Physics, Norwegian University of Science and Technology, 7491 Trondheim, Norway
Marco Di Michiel
Affiliation:
European Synchrotron Radiation Facility, 38000Grenoble, France
Carsten Detlefs
Affiliation:
European Synchrotron Radiation Facility, 38000Grenoble, France
Ragnvald Mathiesen
Affiliation:
Department of Physics, Norwegian University of Science and Technology, 7491 Trondheim, Norway
Anatoly Snigirev
Affiliation:
Immanuel Kant Baltic Federal University, 238300Kaliningrad, Russia
*
* Corresponding author, email: [email protected]

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 552 - 553
Copyright
© Microscopy Society of America 2018 

References

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