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Growth and Characterization of (110) InAs Quantum Well Heterostructures by Transmission Electron Microscopy and Electron Channeling Contrast Imaging

Published online by Cambridge University Press:  23 September 2015

Michael B. Katz
Affiliation:
Division of Electronic Science & Technology, US Naval Research Laboratory, Washington, DC, USA Post-Doctoral Research Associate, National Research Council, Washington, DC, USA
Mark E. Twigg
Affiliation:
Division of Electronic Science & Technology, US Naval Research Laboratory, Washington, DC, USA
Adrian A. Podpirka
Affiliation:
Division of Electronic Science & Technology, US Naval Research Laboratory, Washington, DC, USA Post-Doctoral Research Associate, National Research Council, Washington, DC, USA
Mike Hernandez
Affiliation:
Nanotechnology Systems Division, Hitachi High Technologies America, Inc., Clarksburg, MD, USA
Shawn Mack
Affiliation:
Division of Electronic Science & Technology, US Naval Research Laboratory, Washington, DC, USA
Brian R. Bennett
Affiliation:
Division of Electronic Science & Technology, US Naval Research Laboratory, Washington, DC, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Lihl, R., et al, J. Microsc 118 (1980). p. 89.Google Scholar
[2] Ernst, F. & Pirouz, P., J. Mater. Res 4 (1989). p. 834.Google Scholar