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Gridless TEM Supports Promise Greater Experimental Throughput

Published online by Cambridge University Press:  31 July 2006

PS Hollis  and
FR Powell
PS Hollis
Affiliation:
Luxel Corporation
FR Powell
Affiliation:
Luxel Corporation

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1590 - 1591
Copyright
© 2006 Microscopy Society of America