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Grains and Strains from Cepstral Analysis of 4D-STEM Nano-Diffraction Datasets

Published online by Cambridge University Press:  01 August 2018

Elliot Padgett
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY
Paul Cueva
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY
Megan E. Holtz
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY Department of Materials Science and Engineering, Cornell University, Ithaca, NY
Eric Langenberg
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY
Dong Ren
Affiliation:
Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY
Hector D. Abruna
Affiliation:
Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY
Darrell Schlom
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Tate, M. W., et al, Microscopy and Microanalysis 22 2016) p. 237.Google Scholar
[2] Noll, A. M. The Journal of the Acoustical Society of America 41 1967) p. 293.Google Scholar
[3] E.P. acknowledges support from a NSF Graduate Research Fellowship (DGE-1650441) and DOE EERE (DE-EE0007271). M.E.H. supported by DOE-BES (DE-SC0002334). Electron microscopy facility support from NSF MRSEC program (DMR-1719875) and NSF MRI grant (DMR-1429155).Google Scholar