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Grain Boundary Analysis of Inconel 718 Using a Novel Atom Probe Design

Published online by Cambridge University Press:  01 August 2018

Katherine P. Rice ,
Robert M. Ulfig ,
Yimeng Chen ,
Ty J. Prosa  and
David J. Larson
Katherine P. Rice
Affiliation:
CAMECA Instruments Inc, Madison, WIUSA
Robert M. Ulfig
Affiliation:
CAMECA Instruments Inc, Madison, WIUSA
Yimeng Chen
Affiliation:
CAMECA Instruments Inc, Madison, WIUSA
Ty J. Prosa
Affiliation:
CAMECA Instruments Inc, Madison, WIUSA
David J. Larson
Affiliation:
CAMECA Instruments Inc, Madison, WIUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2212 - 2213
Copyright
© Microscopy Society of America 2018 

References

[1] Babinsky, K., De Kloe, R., Clemens, H. Primig, S. A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction. Ultramicroscopy. 144 2014.Google Scholar
[2] Phillips, P.J., McAllister, D., Gao, Y., Lv, D., Williams, R.E.A., Peterson, B., Wang, Y. Mills, M.J. Nano y’/y” composite precipitates in Alloy 718. Appl. Phys. Lett. 100 2012.Google Scholar
[3] Larson, D. J., et al. Microstructural Investigations in Metals Using Atom Probe Tomography with a Novel Specimen-Electrode Geometry. Journal of Metals 2018) in press.Google Scholar