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Getting the Best from an Imperfect Detector - an Alternative Normalisation Procedure for Quantitative HAADF STEM

Published online by Cambridge University Press:  27 August 2014

Lewys Jones ,
Gerardo T. Martinez ,
Armand Béché ,
Sandra Van Aert  and
Peter D. Nellist
Lewys Jones
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Gerardo T. Martinez
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Armand Béché
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Sandra Van Aert
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Peter D. Nellist
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 126 - 127
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Lebeau, J. M., Stemmer, S. Ultramicroscopy 108 (2008), p. 1653–8.Google Scholar
[2] H. E et al, Ultramicroscopy 133 (2013), p. 109–19.Google Scholar
[3] Martinez, G. T., et al Ultramicroscopy 137 (2013), p.12-19.Google Scholar
[4] MacArthur, K., Jones, L., Nellist, P. Journal of Physics: Confernce Series (2013),in press.Google Scholar
[5] Rosenauer, A., Schowalter, M. Proceedings in Physics 120 (2007), p. 169-72.Google Scholar
[6] The authors acknowledge funding from the UK-EPSRC and EU-ESTEEM2 programmes.Google Scholar