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Future Trends for Quantitative X-Ray Microanalysis is a Field Emission Scanning Electron Microscope at Low Beam Energies

Published online by Cambridge University Press:  31 July 2006

R Gauvin
R Gauvin
Affiliation:
McGill University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 840 - 841
Copyright
© 2006 Microscopy Society of America