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Fundamental aspects of SXES in the Quantification of Minerals and Materials

Published online by Cambridge University Press:  30 July 2021

Nicholas Wilson ,
Colin MacRae  and
Aaron Torpy
Nicholas Wilson
Affiliation:
CSIRO Mineral Resources, Clayton, Australia
Colin MacRae
Affiliation:
CSIRO Mineral Resources, Clayton, Victoria, Australia
Aaron Torpy
Affiliation:
CSIRO Mineral Resources, Clayton, Australia

Abstract

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Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1368 - 1369
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Takahashi, H. Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes. JEOL News. 2014.Google Scholar
Takahashi, H, McSwiggen, P, Nelson, C. A Unique Wavelength-dispersive Soft X-ray Emission spectrometer for electron probe x-ray microanalysers. Microscopy and Analysis. 2014.Google Scholar
Moy, A, Fournelle, J, von der Handt, A. Quantitative Measurement of Iron-Silicides by EPMA Using the Fe Lα and Lβ X-ray Lines: A New Twist to an Old Approach. Microsc Microanal. 2019;25(3):664-74.CrossRefGoogle Scholar