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Full-Scale Characterization of UVLED AlxGa1-xN Nanowires Via Advanced Electron Microscopy

Published online by Cambridge University Press:  09 October 2013

P. Phillips ,
S. Carnevale ,
R. Kumar ,
R. Myers  and
R.F. Klie
P. Phillips
Affiliation:
S. Carnevale
Affiliation:
R. Kumar
Affiliation:
R. Myers
Affiliation:
R.F. Klie
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1520 - 1521
Copyright
Copyright © Microscopy Society of America 2013