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Full-field Spectral Measurement of a Synchrotron Beam After a Multi-layer Monochromator Using a Hyperspectral X-ray Camera.

Published online by Cambridge University Press:  10 August 2018

Matthieu N. Boone ,
Frederic Van Assche ,
Sander Vanheule ,
Silvia Cipiccia ,
Hongchang Wang ,
Laszlo Vincze  and
Luc Van Hoorebeke
Matthieu N. Boone
Affiliation:
UGCT-RP, Dept. Physics and Astronomy, Ghent University, Proeftuinstraat 86/N12, B-9000 Gent, Belgium
Frederic Van Assche
Affiliation:
UGCT-RP, Dept. Physics and Astronomy, Ghent University, Proeftuinstraat 86/N12, B-9000 Gent, Belgium
Sander Vanheule
Affiliation:
UGCT-RP, Dept. Physics and Astronomy, Ghent University, Proeftuinstraat 86/N12, B-9000 Gent, Belgium
Silvia Cipiccia
Affiliation:
Diamond Light source, Diamond House, Harwell Science and Innovation Campus, Fermi Ave, Didcot OX11 0DE
Hongchang Wang
Affiliation:
Diamond Light source, Diamond House, Harwell Science and Innovation Campus, Fermi Ave, Didcot OX11 0DE
Laszlo Vincze
Affiliation:
X-ray Microspectroscopy and Imaging group (XMI), Dept. of Analytical Chemistry,Ghent University, Krijgslaan 281 S12, B-9000 Ghent, Belgium
Luc Van Hoorebeke
Affiliation:
UGCT-RP, Dept. Physics and Astronomy, Ghent University, Proeftuinstraat 86/N12, B-9000 Gent, Belgium

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 324 - 325
Copyright
© Microscopy Society of America 2018 

References

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[2] Scharf, O., et al, Anal. Chem. 83 2011) p 2532–2538.Google Scholar
[3] Rau, C., et al, Phys Status Solidi 208(11 2011) p 2522–2525.Google Scholar