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Full Field X-Ray Imaging - Microanalysis between Table Top and Free Electron Laser Experiments

Published online by Cambridge University Press:  08 April 2017

H Soltau ,
R Hartmann ,
A Hartmann ,
P Holl ,
S Ihle ,
Ch Thamm ,
A Liebel ,
I Ordavo ,
G Schaller  and
F Schopper
...Show all authors
H Soltau
Affiliation:
PNSensor GmbH
R Hartmann
Affiliation:
PNSensor GmbH
A Hartmann
Affiliation:
PNSensor GmbH
P Holl
Affiliation:
PNSensor GmbH
S Ihle
Affiliation:
PNSensor GmbH
Ch Thamm
Affiliation:
PNSensor GmbH
A Liebel
Affiliation:
PNDetector GmbH
I Ordavo
Affiliation:
PNDetector GmbH
G Schaller
Affiliation:
MPI Halbleiterlabor
F Schopper
Affiliation:
MPI Halbleiterlabor
L Strüder
Affiliation:
MPI Halbleiterlabor

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 910 - 911
Copyright
Copyright © Microscopy Society of America 2011