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From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging

Published online by Cambridge University Press:  23 September 2015

Hua Guo ,
Liang Jin ,
Penghan Lu ,
Zhangjie Wang ,
Zhiwei Shan ,
Benjamin Bammes ,
Michael Spilman  and
Robert Bilhorn
Hua Guo
Affiliation:
Direct Electron, LP, San Diego, CA, USA
Liang Jin
Affiliation:
Direct Electron, LP, San Diego, CA, USA
Penghan Lu
Affiliation:
Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
Zhangjie Wang
Affiliation:
Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
Zhiwei Shan
Affiliation:
Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), Hysitron Applied Research Center in China (HARCC), XJTU-Hitachi High-Tech Research & Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
Benjamin Bammes
Affiliation:
Direct Electron, LP, San Diego, CA, USA
Michael Spilman
Affiliation:
Direct Electron, LP, San Diego, CA, USA
Robert Bilhorn
Affiliation:
Direct Electron, LP, San Diego, CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 343 - 344
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Williams, D.B. & Carter, C.B., "Transmission Electron Microscopy: A Textbook for Materials", 2nd Ed. (Plenum Press, New York.Google Scholar
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[8] Bammes, B.E., et al., Microscopy & Microanalsis Conference Proceedings (2012) LB-36..Google Scholar