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From Convergent Beam Electron Diffraction to 4D-STEM: New opportunities for revealing structure at the atomic scale

Published online by Cambridge University Press:  30 July 2021

Joanne Etheridge ,
Wei Chao ,
Bryan Esser ,
Weilun Li ,
Harkirat Mann ,
Timothy Petersen  and
Changlin Zheng
Joanne Etheridge
Affiliation:
Monash University, Monash University, Victoria, Australia
Wei Chao
Affiliation:
Monash University, United States
Bryan Esser
Affiliation:
Monash University, United States
Weilun Li
Affiliation:
Monash University, Monash University, Australia
Harkirat Mann
Affiliation:
Monash University, Monash University, Victoria, Australia
Timothy Petersen
Affiliation:
Monash University, United States
Changlin Zheng
Affiliation:
Fudan University, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1980 - 1981
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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