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The f-Ratio Quantification Method for X-ray Microanalysis Applied to Mg–Al–Zn Alloys

Published online by Cambridge University Press:  04 February 2019

Chaoyi Teng ,
Hendrix Demers ,
Xin Chu  and
Raynald Gauvin
Chaoyi Teng*
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada H3A 0C5
Hendrix Demers
Affiliation:
Centre d'excellence en électrification des transports et stockage d’énergie, Hydro-Québec, Varennes, Québec, Canada J3X 1S1
Xin Chu
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada H3A 0C5
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada H3A 0C5
*
*Author for correspondence: Chaoyi Teng, E-mail: [email protected]
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Abstract

The f-ratio quantitative X-ray microanalysis method has been recently developed for binary systems based on a scanning electron microscope/energy dispersive spectroscopy (SEM/EDS) system. This method incorporates traditional EDS experiments and Monte Carlo simulations, and calibration factors are calculated with standard samples to evaluate the differences between them. In this work, the f-ratio method was extended to Mg–Al–Zn multi-element systems using a cold field emission SEM and a tungsten emission SEM. Results show that the stability of the beam current does not influence the f-ratio quantification accuracy. Thus, the f-ratio method is suitable for quantitative X-ray mapping with a long-time acquisition or even an unstable beam current. Comparing with other quantitative techniques including the routine standardless analysis and the standard-based k-ratio method, the f-ratio method is a simple and accurate quantification method.

Keywords

cold field emission scanning electron microscope (CFE-SEM)energy dispersive spectroscopy (EDS)quantitative X-ray microanalysisthe f-ratio method
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 25 , Issue 1 , February 2019 , pp. 58 - 69
Copyright
Copyright © Microscopy Society of America 2019 

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