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Forward modeling of volume electron microscopy (vEM) of stained resin-embedded biological samples

Published online by Cambridge University Press:  30 July 2021

Yu Yuan ,
Sabrina Clusiau ,
Raynald Gauvin ,
Christopher Bleck ,
Adrian Phoulady ,
Pouya Tavousi ,
Sina Shahbazmohamadi ,
Nicolas Piché  and
Mike Marsh
Yu Yuan
Affiliation:
Object Research Systems, United States
Sabrina Clusiau
Affiliation:
Object Research Systems, United States
Raynald Gauvin
Affiliation:
McGill University, Montreal, Quebec, Canada
Christopher Bleck
Affiliation:
National Heart, Lung, and Blood Institute, Bethesda, Maryland, United States
Adrian Phoulady
Affiliation:
REFINE Center, University of Connecticut, United States
Pouya Tavousi
Affiliation:
UConn Tech Park, University of Connecticut, storrs, Connecticut, United States
Sina Shahbazmohamadi
Affiliation:
University of Connecticut, Storrs, Connecticut, United States
Nicolas Piché
Affiliation:
Object Research Systems, United States
Mike Marsh
Affiliation:
Object Research Systems, Denver, Colorado, United States

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 776 - 777
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Rudinsky, S et al. , Microscopy and Microanalysis 25(S2) (2019), p. 222-223.CrossRefGoogle Scholar
Fera, A et al. , Journal of Microscopy 277(2) (2020), p. 71-78.CrossRefGoogle Scholar