Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-30T04:10:00.981Z Has data issue: false hasContentIssue false
  • English
  • Français

Formation mechanism of dominant kinks in GaP nanowires grownin an in-situ (S)TEM gas cell holder investigatedby SPED and SNBED

Published online by Cambridge University Press:  30 July 2021

David Krug ,
Maximilian Widemann ,
Shamail Ahmed ,
Felix Gruber ,
Andreas Beyer  and
Kerstin Volz
David Krug
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, United States
Maximilian Widemann
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Marburg, Hessen, United States
Shamail Ahmed
Affiliation:
STRL, University of Marburg, United States
Felix Gruber
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, United States
Andreas Beyer
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany
Kerstin Volz
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2228 - 2230
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Yan, R., et al. , Nature Photonics 3 (2009), pp. 569-576.CrossRefGoogle Scholar
Allard, L. F., et al. , Microscopy and Microanalysis 18 4 (2012), pp. 656-666.CrossRefGoogle Scholar
Straubinger, R., et al. , Microscopy and Microanalysis 23 4 (2017), pp. 751-757.CrossRefGoogle Scholar
Wagner, R. S., Ellis, W. C., Applied Physics Letters 4 (1964), pp. 89.Google Scholar
Rauch, E., et al. , Z. Kristallogr. 225 (2010) pp. 103-109.CrossRefGoogle Scholar