Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-17T11:26:11.224Z Has data issue: false hasContentIssue false
  • English
  • Français

Focused Ion Beam Nano-Tomography Using Different Detectors

Published online by Cambridge University Press:  09 April 2017

M Cantoni ,
P Burdet ,
G Knott  and
C Hébert
M Cantoni
Affiliation:
Ecole Polytechnique Federale de Lausanne, Switzerland
P Burdet
Affiliation:
Ecole Polytechnique Federale de Lausanne, Switzerland
G Knott
Affiliation:
Ecole Polytechnique Federale de Lausanne, Switzerland
C Hébert
Affiliation:
Ecole Polytechnique Federale de Lausanne, Switzerland

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 882 - 883
Copyright
Copyright © Microscopy Society of America 2011