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Focused ion beam deposited carbon-platinum nanowires for cryogenic resistive thermometry

Published online by Cambridge University Press:  30 July 2021

Kirsten Blagg ,
Portia Allen ,
Tzu-Ming Lu ,
Michael Lilly  and
Meenakshi Singh
Kirsten Blagg
Affiliation:
Colorado School of Mines, United States
Portia Allen
Affiliation:
Colorado School of Mines, United States
Tzu-Ming Lu
Affiliation:
Sandia National Labs, United States
Michael Lilly
Affiliation:
Sandia National Labs, United States
Meenakshi Singh
Affiliation:
Colorado School of Mines, United States

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 208 - 210
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Pobell, F., Matter and methods at low temperatures, Vol. 2, Springer, 2007CrossRefGoogle Scholar
Fernandez-Pacheco, A., De Teresa, J., Cordoba, R., Ibarra, M., Metal-insulator transition in pt-c nanowires grown by focused-ion-beam-induced deposition, Physical Review B 79 (17) 174204 (2009).CrossRefGoogle Scholar
Beloborodov, I., Lopatin, A., Vinokur, V., Efetov, K., Granular electronic systems, Reviews of Modern Physics 79 (2) 469 (2007)Google Scholar