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Focused Ion Beam Characterization of Bicomponent Polymer Fibers

Published online by Cambridge University Press:  17 March 2010

K.C. Wong ,
C.M. Haslauer ,
N. Anantharamaiah ,
B. Pourdeyhimi ,
A.D. Batchelor  and
D.P. Griffis
K.C. Wong
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Campus Box 7531 Room 318 MRC, 2410 Campus Shore Dr., Raleigh, NC 27695, USA Department of Materials Science and Engineering, North Carolina State University, Campus Box 7907, Raleigh, NC 27695-7907, USA
C.M. Haslauer
Affiliation:
North Carolina State University and University of North Carolina-Chapel Hill, Joint Department of Biomedical Engineering, 2142 Burlington Laboratories, Campus Box 7115, Raleigh, NC 27695-7115, USA
N. Anantharamaiah
Affiliation:
Nonwovens Cooperative Research Center, The Nonwovens Institute, North Carolina State University, Raleigh, NC 27695, USA
B. Pourdeyhimi
Affiliation:
Nonwovens Cooperative Research Center, The Nonwovens Institute, North Carolina State University, Raleigh, NC 27695, USA
A.D. Batchelor
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Campus Box 7531 Room 318 MRC, 2410 Campus Shore Dr., Raleigh, NC 27695, USA Department of Materials Science and Engineering, North Carolina State University, Campus Box 7907, Raleigh, NC 27695-7907, USA
D.P. Griffis*
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Campus Box 7531 Room 318 MRC, 2410 Campus Shore Dr., Raleigh, NC 27695, USA Department of Materials Science and Engineering, North Carolina State University, Campus Box 7907, Raleigh, NC 27695-7907, USA
*
Corresponding author. E-mail: [email protected]
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Abstract

Previous work has shown that focused ion beam (FIB) nanomachining can be effectively utilized for the cross-sectional analysis of polymers such as core-shell solid microspheres and hollow latex nanospheres. While these studies have clearly demonstrated the precise location selection and nanomachining control provided by the FIB technique, the samples studied consisted of only a single polymer. In this work, FIB is used to investigate bicomponent polymeric fiber systems by taking advantage of the component's differing sputter rates that result from their differing physical properties. An approach for cross sectioning and thus revealing the cross-sectional morphology of the polymeric components in a bicomponent polymeric fiber with the island-in-the-sea (I/S) structure is presented. The two I/S fibers investigated were fabricated using the melt spinning process and are composed of bicomponent combinations of linear low density polyethylene (LLDPE) and nylon 6 (PA6) or polylactic acid (PLA) and an EastONETM proprietary polymer. Topographical contrast as a result of differential sputtering and the high surface specificity and high signal-to-noise obtained using FIB-induced secondary electron imaging is shown to provide a useful approach for the rapid characterization of the cross-sectional morphology of bicomponent polymeric fibers without the necessity of staining or other sample preparation.

Keywords

bicomponent polymer fibercharacterizationfocused ion beamdifferential sputteringion-induced secondary electron imagingbiaxial cross section
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 16 , Issue 3 , June 2010 , pp. 282 - 290
Copyright
Copyright © Microscopy Society of America 2010

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References

REFERENCES

Abdi, O., Wong, K.C., Hassan, T., Peters, K.J. & Kowalsky, M.J. (2009). Cleaving of solid single mode polymer optical fiber for strain sensor applications. Opt Commun 282, 856–861.CrossRefGoogle Scholar
Barner, L., Li, C., Hao, X., Stenzel, M., Barner-Kowollik, C. & Davis, T. (2004). Synthesis of core-shell poly(divinylbenzene) microspheres via reversible addition fragmentation chain transfer graft polymerization of styrene. Surf Coat Tech 42, 5067–5076.Google Scholar
Beach, E., Keefe, M., Heeschen, W. & Rothe, D. (2005). Cross-sectional analysis of hollow latex particles by focused ion beam-scanning electron microscopy. Polymer 46, 11195–11197.CrossRefGoogle Scholar
Bright, D.S., Newbury, D.E. & Steel, E.B. (1998). Visibility of objects in computer simulations of noisy micrographs. J Microsc 189, 25–42.CrossRefGoogle ScholarPubMed
Brostow, W., Gorman, B. & Olea-Mejia, O. (2007). Focused ion beam milling and scanning electron microscopy characterization of polymer + metal hybrids. Mater Lett 61, 1333–1336.CrossRefGoogle Scholar
Brunner, S., Tharian, P.J., Simmler, H. & Ghazi Wakili, K. (2008). Focused ion beam (FIB) etching to investigate aluminium-coated polymer laminates subjected to heat and moisture loads. Surf Coat Tech 202, 6054–6063.CrossRefGoogle Scholar
Burke, E. (1980). Secondary emission from polymers. IEEE Trans Nucl Sci 6, 1760–1764.Google Scholar
Castaldo, V., Hagen, C., Rieger, B. & Kruit, P. (2008). Sputtering limits versus signal-to-noise limits in the observation of Sn balls in a Ga+ microscope. J Vac Sci Technol B 26, 2107–2115.CrossRefGoogle Scholar
Fedorova, N. (2006). Investigation of the Utility of Islands-in-the-Sea Bicomponent Fiber Technology in the Spunbond Process. Electronic thesis (Ph.D.), North Carolina State University.Google Scholar
Fedorova, N. & Pourdeyhimi, B. (2007). High strength nylon micro- and nanofiber based nonwovens via spunbonding. J Appl Polym Sci 104, 3434–3442.CrossRefGoogle Scholar
Garcia, R., Fedorova, N., Knowlton, V., Oldham, C. & Pourdeyhimi, B. (2005). Sample preparation for textile nanofiber composites. Microsc Today 13, 38.CrossRefGoogle Scholar
Giannuzzi, L. & Stevie, F. (2005). Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice. New York: Springer.CrossRefGoogle Scholar
Goldstein, J., Newbury, D., Joy, D., Lyman, C., Echlin, P., Lifshin, E., Sawyer, L. & Michael, J. (2003). Scanning Electron Microscopy and X-Ray Microanalysis. New York: Springer.CrossRefGoogle Scholar
Ishitani, T. & Tsuboi, H. (1997). Objective comparison of scanning ion and scanning electron microscope images. Scanning 19, 489–497.CrossRefGoogle Scholar
Kato, M., Ito, T., Aoyama, Y., Sawa, K., Kaneko, T., Kawase, N. & Jinnai, H. (2007). Three-dimensional structural analysis of a block copolymer by scanning electron microscopy combined with a focused ion beam. J Polym Sci Pol Phys 45, 677–683.CrossRefGoogle Scholar
Magni, S., Milani, M., Riccardi, C. & Tatti, F. (2007). IB-SEM Characterization of carbon-based fibers. Scanning 29, 185–195.CrossRefGoogle ScholarPubMed
Munroe, P.R. (2009). The application of focused ion beam microscopy in the material sciences. Mater Charact 60, 2–13.CrossRefGoogle Scholar
Ohya, K. & Ishitani, T. (2003). Comparative study of depth and lateral distributions of electron excitation between scanning ion and scanning electron microscopes. J Electron Microsc 52, 291–298.CrossRefGoogle ScholarPubMed
Osathanon, T., Linnes, M., Rajachar, R., Ratner, B., Somerman, M. & Giachelli, C. (2008). Microporous nanofibrous fibrin-based scaffolds for bone tissue engineering. Biomaterials 29, 4091–4099.CrossRefGoogle ScholarPubMed
Plummer, H.K. (1997). Reflections on the use of microtomy for materials science specimen preparation. Microsc Microanal 3, 239–260.CrossRefGoogle Scholar
Schirillo, J.A. & Shevell, S.K. (1993). Lightness and brightness judgments of coplanar retinally noncontiguous surfaces. J Opt Soc Am A 10, 2442–2452.CrossRefGoogle ScholarPubMed
Severs, N. & Hotton, D. (1995). Rapid Freezing, Freeze Fracture, and Deep Etching. New York: Wiley-Liss Inc.Google Scholar
Song, Z., Ong, C. & Gong, H. (1997). Secondary and backscattered electron yields of polymer surface under electron beam irradiation. Appl Surf Sci 119, 169–175.CrossRefGoogle Scholar
Suzuki, T., Endo, N., Shibata, M., Kamasaki, S. & Ichinokawa, T. (2004). Contrast differences between scanning ion and scanning electron microscope images. J Vac Sci Technol A 22, 49–52.CrossRefGoogle Scholar
Wang, D., Sun, G., Chiou, B. & Hinestroza, J. (2007). Controllable fabrication and properties of polypropylene nanofibers. Polym Eng Sci 47, 1865–1872.CrossRefGoogle Scholar