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Focused Electron-Beam Induced Deposition, In Situ TEM And Off-Axis Electron Holography Investigation of Bi-Magnetic Core-Shell Nanostructures

Published online by Cambridge University Press:  05 August 2019

Trevor P. Almeida ,
Damien McGrouther ,
András Kovács ,
Rafal E. Dunin-Borkowski  and
Stephen McVitie
Trevor P. Almeida*
Affiliation:
SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK.
Damien McGrouther
Affiliation:
SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK.
András Kovács
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany
Rafal E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany
Stephen McVitie
Affiliation:
SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK.

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 56 - 57
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Lavorato, G. C., et al. , J. Alloys Compd. 633, 333–337 (2015).Google Scholar
[2]Lee, J-H., et al. , Nat. Nanotechnol. 6, 418-422 (2011).Google Scholar
[3]De Teresa, J.M, et al. , J. Phys. D: Appl. Phys. 49, 243003 (2016).Google Scholar
[4]Almeida, T. P., et al. , Sci. Adv., 2, e1501801 (2016).Google Scholar
[5]Almeida, T. P., et al. , Geophys. Res. Lett., 43, 8426-8434 (2016).Google Scholar
[6]Hӱtch, M. J., et al. , Phys. Rev. Lett., 91, 257207, 2003.Google Scholar