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Fine structures of Fe L-emission examined by a new HR-SXES instrument
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Unresolved Challenges in Quantitative X-ray Microanalysis
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- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Terauchi, M., Chap. 7 in “Transmission Electron Microscopy Characterization of Nanomaterials” (ed. Kumar C, S S R, Springer-Verlag Berlin Heidelberg, 2014)Google Scholar
Terauchi, M., et al. , IOP Conf. Series: Materials Science and Engineering 304, 012018 (2017).CrossRefGoogle Scholar
Terauchi, M. et al. , IOP Conf. Series: Materials Science and Engineering 891, 012022 (2020).CrossRefGoogle Scholar
This work was partly supported by the Research Program of "Dynamic Alliance for Open Innovation Bridging Human, Environment and Materials" in "Network Joint Research Centre for Materials and Devices"Google Scholar
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