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Fine Structure Mapping in Graphene: From Electronic Transitions to Atomic Orbitals

Published online by Cambridge University Press:  22 July 2022

M. Bugnet ,
M. Ederer ,
V. K. Lazarov ,
L. Li ,
Q. M. Ramasse ,
S. Löffler  and
D. M. Kepaptsoglou
M. Bugnet*
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom School of Chemical and Process Engineering, University of Leeds, Leeds, United Kingdom Univ Lyon, CNRS, INSA Lyon, UCBL, MATEIS, Villeurbanne, France
M. Ederer
Affiliation:
University Service Centre for Transmission Electron Microscopy, TU Wien, Wien, Austria
V. K. Lazarov
Affiliation:
Department of Physics, University of York, York, United Kingdom
L. Li
Affiliation:
Department of Physics and Astronomy, University of West Virginia, Morgantown, West Virginia, USA
Q. M. Ramasse
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom School of Chemical and Process Engineering, University of Leeds, Leeds, United Kingdom School of Physics and Astronomy, University of Leeds, Leeds, United Kingdom
S. Löffler
Affiliation:
University Service Centre for Transmission Electron Microscopy, TU Wien, Wien, Austria
D. M. Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom Department of Physics, University of York, York, United Kingdom
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2554 - 2555
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Copyright
Copyright © Microscopy Society of America 2022

References

Repp, J., et al. , Phys. Rev. Lett. 94, 026803 (2005).10.1103/PhysRevLett.94.026803CrossRefGoogle Scholar
Zuo, J. M., et al. , Nature (London) 401, 49 (1999).10.1038/43403CrossRefGoogle Scholar
Löffler, S., et al. , Ultramicroscopy 177, 26 (2017).Google Scholar
Liu, Y., et al. , Nat. Phys. 10, 294 (2014).Google Scholar
Bugnet, M., et al. , Phys. Rev. Lett. 128, 116401 (2022).10.1103/PhysRevLett.128.116401CrossRefGoogle Scholar
Gao, W., et al. , Nature (London) 575, 480 (2019).10.1038/s41586-019-1649-6CrossRefGoogle Scholar
Müller, K., et al. , Nat. Commun. 5, 5653 (2014).Google Scholar
Sánchez-Santolino, G., et al. , ACS Nano 12, 8875 374 (2018).10.1021/acsnano.8b03712CrossRefGoogle Scholar
The electron microscopy work was supported by the EPSRC (UK). SuperSTEM Laboratory is the EPSRC National Research Facility for Advanced Electron Microscopy. The authors would like to thank Hitachi High-Tech Corporation, Orsay Physics and Tescan, for preparation of the FIB lamellae. MB is grateful to the SuperSTEM Laboratory for microscope access, and to the School of Chemical and Process Engineering at the University of Leeds for a visiting associate professorship and financial support. ME and SL acknowledge funding from the Austrian Science Fund (FWF) under grant no. I4309-N36.Google Scholar