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Field Mapping in Semiconductors by Off-axis Electron Holography: From Devices to Graphene and Single Dopant Atoms

Published online by Cambridge University Press:  27 August 2014

David Cooper ,
Jean-Luc Rouvière  and
Rafal Dunin-Borkowski
David Cooper
Affiliation:
CEA-LETI, Minatec, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
Jean-Luc Rouvière
Affiliation:
CEA-INAC, Minatec, 17 rue des Martyrs 38054 Grenoble Cedex 9, France
Rafal Dunin-Borkowski
Affiliation:
Ernst-Ruska Center for Microscopy and Spectroscopy with Electrons, Research Centre Julich,D-52425 Julich, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 254 - 255
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Cooper, D, et al Semiconductor Science and Technology 28 2013), p. 125013.Google Scholar
[2] D Cooper thanks the European Research Council for funding this work with the Starting Grant 325525 "Holoview".Google Scholar