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FIB milling of polymer ceramic nanocomposites: far-reaching thermal artefacts and application to analysis of corrosion barrier coatings

Published online by Cambridge University Press:  25 July 2016

Konrad Rykaczewski
Affiliation:
School for Engineering of Transport, Matter and Energy, Arizona State University, Tempe, AZ, US
Daniel G. Mieritz
Affiliation:
Department of Chemistry and Biochemistry, Arizona State University, Tempe, AZ, US
Minglu Liu
Affiliation:
School for Engineering of Transport, Matter and Energy, Arizona State University, Tempe, AZ, US
Yuanyu Ma
Affiliation:
School for Engineering of Transport, Matter and Energy, Arizona State University, Tempe, AZ, US
Erick B. Iezzi
Affiliation:
Naval Research Laboratory, Chemistry Division, Washington, DC, US
Xiaoda Sun
Affiliation:
School for Engineering of Transport, Matter and Energy, Arizona State University, Tempe, AZ, US
Liping P. Wang
Affiliation:
School for Engineering of Transport, Matter and Energy, Arizona State University, Tempe, AZ, US
Kiran N. Solanki
Affiliation:
School for Engineering of Transport, Matter and Energy, Arizona State University, Tempe, AZ, US
Don K. Seo
Affiliation:
Department of Chemistry and Biochemistry, Arizona State University, Tempe, AZ, US
Robert Y. Wang
Affiliation:
School for Engineering of Transport, Matter and Energy, Arizona State University, Tempe, AZ, US

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Stevie, F., Giannuzzi, L. & Prenitzer, B. Introduction to focused ion beams: instrumentation, theory. techniques and practice (2005) New York: Springer.Google Scholar
[2] Chen, B., et al., Scientific Reports 3 (2013) 1177.CrossRefGoogle Scholar
[3] Nguyen, T., et al., Journal of Coatings Technology 68 (1996) 4556.Google Scholar
[4] Volkert, C. A. & Minor, A. M. MRS Bulletin 32 (2007) 389399.CrossRefGoogle Scholar
[5] Bassim, N. D., et al, Journal of Microscooy 245 (2012) 288301.CrossRefGoogle Scholar
[6] Schmied, R., et al., Physical Chemistry Chemical Physics 16 (2014) 61536158.CrossRefGoogle Scholar
[7] Orthacker, A., et al., Physical Chemistry Chemical Physics 16 (2014) 16581666.Google Scholar
[8] Iezzi, E. B., et al., Naval Research Laboratory Review (2013).Google Scholar
[9] Iezzi, E. B. & US, E. B. Patent US 8133964 B2 (2012).Google Scholar
[10] Rykaczewski, K., et al., Journal of Microscopy (2015). DOI: 10.1111/jmi. 12367.Google Scholar
[11] KR, KNS, and LPW acknowledge funding from US Department of Defense under Technical Corrosion Collaboration Program administered by the US Air Force Academy through grant no. FA7000-14-2-0015. Authors gratefully acknowledge the use of facilities with the LeRoy Eyring Center for Solid State Science at Arizona State University.Google Scholar