Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-20T18:22:59.142Z Has data issue: false hasContentIssue false

Feasibility of Be Analysis For Geologic Materials Using Epma

Published online by Cambridge University Press:  02 July 2020

Joseph Evensen
Affiliation:
Department of Geochemistry, Colorado School of Mines, Golden, Colorado80401
Gregory P. Meeker
Affiliation:
Geologic Division, U.S. Geological Survey, Denver, Colorado, 80225
Get access

Extract

Microanalytical techniques for the analysis of beryllium using the electron probe have been evaluated for Be metal, Be-rich silicate minerals, and three Be-rich synthetic silicate glasses. Despite difficulties typical of ultra-light element analysis in geologic materials, quantitative data for Be may be obtainable through careful analytical measurements, determination of optimal operating conditions, and consideration of parameters such as sample orientation and beam-induced migration.

Analyses for Be were obtained using a layered synthetic microstructure “crystal” (Mo/B4C) on the JEOL 8900 electron microprobe at the USGS, Denver, Colorado. The optimum accelerating voltage for Be detection was determined to be 8kV (Fig.l). Beryllium analyses in glass and mineral phases were successful using a beam current of 30nA and a 50 μm beam diameter. Due to low count rates, peak counting times of 10 minutes (beryl) and 30 minutes (glass) were required in order to achieve reasonable counting statistics and detection limits.

Type
Quantitative Biological and Materials Microanalysis by Electrons and X-Rays
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

McGee, J., In Reviews in Mineralogy, 33(1996)771.Google Scholar
Raudsepp, M., The Canadian Mineralogist, 33(1995)203.Google Scholar
Bastin, G.F. and Heijligers, H.J.M., Scanning, 12(1990)225.10.1002/sca.4950120408CrossRefGoogle Scholar
Armstrong, J., Microbeam Analysis ‘88, 301.Google Scholar