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Fast Solid-state Segmented Detectors: Improvements and Implications for DPC-STEM

Published online by Cambridge University Press:  22 July 2022

Tiarnan Mullarkey ,
Jonathan J.P. Peters ,
Grigore Moldovan ,
Jonathan Garel  and
Lewys Jones
Tiarnan Mullarkey*
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland Centre for Doctoral Training in the Advanced Characterisation of Materials, AMBER Centre, Dublin, Ireland
Jonathan J.P. Peters
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland
Grigore Moldovan
Affiliation:
point electronic GmbH, Erich-Neuss-Weg 15, D-06120, Halle (Saale), Germany
Jonathan Garel
Affiliation:
El-Mul Technologies Ltd, Rehovot, Israel
Lewys Jones
Affiliation:
School of Physics, Trinity College Dublin, Dublin, Ireland Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures & Nanodevices (CRANN), Dublin
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2486 - 2487
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Copyright
Copyright © Microscopy Society of America 2022

References

Lazić, I., Bosch, E.G.T., Lazar, S., Phase contrast STEM for thin samples: Integrated differential phase contrast, Ultramicroscopy. 160 (2016) 265–280.10.1016/j.ultramic.2015.10.011CrossRefGoogle ScholarPubMed
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Ishizuka, A., Ishizuka, K., Observation of Phase Objects using STEM-Differential Phase Contrast (DPC) Microscopy, JEOL News. 55 (2020).Google Scholar
Mullarkey, T., Downing, C., Jones, L., Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM, Microsc. Microanal. 27 (2021) 99–108.10.1017/S1431927620024721CrossRefGoogle ScholarPubMed
The authors would like to acknowledge the Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) and the Advanced Materials and BioEngineering Research (AMBER) Network for financial and infrastructural support for this work. L.J is supported by award URF/RI/191637. J.J.P.P. and L.J. acknowledge SFI grant 19/FFP/6813, T.M. acknowledges the SFI & EPSRC Centre for Doctoral Training in the Advanced Characterisation of Materials (awardreferences 18/EPSRC-CDT-3581 and EP/S023259/1).Google Scholar