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Fast Amplitude Modulation Detector for Scanning Force Microscopy with High Q Factor

Published online by Cambridge University Press:  02 October 2012

Yizhi Shi  and
Qingyou Lu
Yizhi Shi
Affiliation:
Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China
Qingyou Lu*
Affiliation:
Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei, Anhui 230031, People's Republic of China
*
*Corresponding author. E-mail: [email protected]
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Abstract

Amplitude modulation (AM) scanning force microscopy (SFM) is superior to frequency modulation SFM in simplicity, sensitivity, and stability, but is still replaced by the latter because it is too slow when the Q factor is high (bandwidth < 0.5 Hz for Q > 50,000 and resonant frequency ω0 < 50 kHz). We report a close-loop AM detector that has an 18 Hz bandwidth, better than 1 mHz frequency resolution and excellent response to step frequency changes even for Q ∼ 60,000 and ω0 ∼ 32 kHz. Its superiority is well shown by the comparison of magnetic force microscope images taken under the new and old AM detection modes with the tip and scan area (videotape sample) being unchanged. Also important is that shifting the driving frequency from near the resonance peak to further away from the peak does not decrease the frequency resolution as much as we expect (but can increase the response speed).

Keywords

amplitude modulation AFMfrequency modulation AFMscanning force microscopydynamic resonant frequencyQ-controlmagnetic force microscopy
Type
Techniques and Equipment Development
Information
Microscopy and Microanalysis , Volume 18 , Issue 5 , October 2012 , pp. 1016 - 1020
Copyright
Copyright © Microscopy Society of America 2012

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