Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-27T06:31:06.618Z Has data issue: false hasContentIssue false
  • English
  • Français

Falcon 4 performance validation by single event analysis

Published online by Cambridge University Press:  30 July 2021

Jeroen Keizer ,
Gerald van Hoften ,
Jaap Mulder  and
Gijs van Duinen
Jeroen Keizer
Affiliation:
Thermo Fisher Scientific, United States
Gerald van Hoften
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Jaap Mulder
Affiliation:
Thermo Fisher Scientific, United States
Gijs van Duinen
Affiliation:
Thermo Fisher Scientific, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1338 - 1339
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

McMullan, G, Chen, S, Henderson, R, Faruqi, AR. Detective quantum efficiency of electron area detectors in electron microscopy. Ultramicroscopy. 2009a; 109:1126–1143.CrossRefGoogle Scholar
Faruqi, A.R. & McMullan, G.. (2017). Direct imaging detectors for electron microscopy. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 878. 10.1016/j.nima.2017.07.037.Google Scholar
Kuijper, Maarten & Hoften, Gerald & Janssen, Bart & Geurink, Rudolf & De Carlo, Sacha & Vos, Matthijn & Duinen, Gijs & Haeringen, Bart & Storms, Marc. (2015). FEI's direct electron detector developments: Embarking on a revolution in cryo-TEM. Journal of structural biology. 192. 10.1016/j.jsb.2015.09.014.Google ScholarPubMed