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Fact or Fiction: Maximal Image Quality with Minimal Dwell Time

Published online by Cambridge University Press:  01 August 2018

Patrick Trampert ,
Tim Dahmen  and
Philipp Slusallek
Patrick Trampert
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), Saarbrucken, Germany Saarland University, Saarbrucken, Germany
Tim Dahmen
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), Saarbrucken, Germany
Philipp Slusallek
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), Saarbrucken, Germany Saarland University, Saarbrucken, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 480 - 481
Copyright
© Microscopy Society of America 2018 

References

[1] Hawe, S., etal, IEEE Trans. Image Process 22(6 2013) p. 2138.Google Scholar
[2] Villena, S., et al, IEEE Intern Conf. on Image Process 2010) p. 893.Google Scholar
[3] Stevens, A., et al, Microscopy 63(1 2014) p. 41.Google Scholar
[4] Trampert, P., et al, Microsc. Microanal. 22(S3 2016) p. 554.Google Scholar
[5] Trampert, P., et al “How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?”, Ultramicroscopy, under revision.Google Scholar
[6] Research has been supported by Thermo Fisher Scientific. The authors thank the DFKI GmbH for additional funding and for providing the necessary infrastructure.Google Scholar