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Fabrication of Self-Supporting Annular Apertures for Use in the Transmission Electron Microscope

Published online by Cambridge University Press:  23 September 2015

Liya Yu ,
Aaron C. Johnston-Peck ,
Andrew A. Herzing  and
Vincent Luciani
Liya Yu
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards Technology, Gaithersburg, MD 20899 USA
Aaron C. Johnston-Peck
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA
Andrew A. Herzing
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA
Vincent Luciani
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards Technology, Gaithersburg, MD 20899 USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1949 - 1950
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] McMorran, B.J., et al, Science 331 (2011). p 192.Google Scholar
[2] Bals, S., Kilass, R. & Kisielowski, C., Ultramicroscopy 104 (2005). p 281.Google Scholar
[3] A.C.J.-P. acknowledges support of the National Research Council Postdoctoral Research Associateship Program.Google Scholar