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Fabrication of a Lift-Out Grid with Electrical Contacts for Focused Ion Beam Preparation of Lamella for In Situ Transmission Electron Microscopy

Published online by Cambridge University Press:  09 October 2013

M. Mecklenburg ,
M. Brodie ,
W. Hubbard ,
E.R. White ,
A. Bushmaker ,
E. Deionno ,
B. Foran  and
B.C. Regan
M. Mecklenburg
Affiliation:
M. Brodie
Affiliation:
W. Hubbard
Affiliation:
E.R. White
Affiliation:
A. Bushmaker
Affiliation:
E. Deionno
Affiliation:
B. Foran
Affiliation:
B.C. Regan
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 458 - 459
Copyright
Copyright © Microscopy Society of America 2013