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Extracting Thickness and Tilt From 4D-STEM Datasets to Model the Influence on ABF Images

Published online by Cambridge University Press:  01 August 2018

Abinash Kumar ,
Celesta S. Chang ,
Everett D. Grimley ,
Zhen Chen  and
James M. LeBeau
Abinash Kumar
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC.
Celesta S. Chang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY.
Everett D. Grimley
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC.
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY.
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 216 - 217
Copyright
© Microscopy Society of America 2018 

References

[1] May, S. J., et al, Physical Review B 82 2010) p. 014110.Google Scholar
[2] LeBeau, J. M., et al, Ultramicroscopy 110 2010) p. 118.Google Scholar
[3] Hwang, J., et al, Applied Physics Letters 100 2012) p. 191909.Google Scholar
[4] Tate, M. W., et al, Microscopy and Microanalysis 22 2016) p. 237.Google Scholar
[5] We would like to thank D. A. Muller for supplying the EMPAD data acquired from a thin film grown by H. Nair and D. G. Schlom. This material is based upon work supported by the National Science Foundation, as part of the Center for Dielectrics and Piezoelectrics under Grant Nos. IIP-1361571 and IIP-1361503.Google Scholar