Extension Tip of Lift-Out Probe in FIB Systems

SX Wang

doi:10.1017/S1431927606061915

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Extension Tip of Lift-Out Probe in FIB Systems

Published online by Cambridge University Press: 31 July 2006

SX Wang

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SX Wang: Affiliation:
Micron Technology Inc.

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type: Abstract
Information: Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1316 - 1317

DOI: https://doi.org/10.1017/S1431927606061915 [Opens in a new window]
Copyright: © 2006 Microscopy Society of America

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Extension Tip of Lift-Out Probe in FIB Systems

Volume 12, Issue S02
SX Wang ^(a1)
DOI: https://doi.org/10.1017/S1431927606061915

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Extension Tip of Lift-Out Probe in FIB Systems

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