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Extending lab-based X-ray nanotomography of low Z and porous materials to larger sample volumes without compromising resolution

Published online by Cambridge University Press:  30 July 2021

Silvan Englisch
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany
Janis Wirth
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany
Dominik Drobek
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany
Benjamin Apeleo Zubiri
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany
Erdmann Spiecker
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany

Abstract

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Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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7. We gratefully acknowledge financial support by the German Research Foundation (DFG) within the frameworks of the research training group GRK1896 “In situ Microscopy with Electrons, X-rays and Scanning Probes”, the project SP648/8 “High-resolution X-ray microscopy for correlative tomography, high throughput screening and in situ mechanical testing of structural and functional materials” (Project ID 316992193), the Collaborative Research Centre 1411 “Design of Particulate Products” (Project ID 416229255) and the Collaborative Research Centre 1452 "Catalysis at Liquid Interfaces". We thank P. Wasserscheid, W. Schwieger and their research groups for providing the SCALMS and Zeolite samples used in this study.Google Scholar