Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-27T03:38:45.334Z Has data issue: false hasContentIssue false
  • English
  • Français

Extended High Efficiency Computed Tomography with Optimized Recursions

Published online by Cambridge University Press:  01 August 2018

Wolfram R. Jarisch ,
Michael J. Curry  and
Peter J. Basser
Wolfram R. Jarisch
Affiliation:
Cyber Technology, Inc., Potomac, MD, U.S.A.
Michael J. Curry
Affiliation:
CS Department, University of Maryland, College Park, U.S.A.
Peter J. Basser
Affiliation:
NICHD, National Institutes of Health, Bethesda, MD, U.S.A.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 528 - 529
Copyright
© Microscopy Society of America 2018 

References

[1] Jarisch, W U.S. Patent Application No. 15/816,745, Nov. 2017.Google Scholar
[2] Man, B De, et al.. (2005) IEEE Nuclear Science Symposium Conference Record.Google Scholar
[3] Zhang-O’Connor, Y Fessler, J A IEEE Trans. Medical Imag. 25 2006.Google Scholar
[4] Men, H Fessler, J A Rad. and Nuc. Med. 2015) p. 260.Google Scholar
[5] Jarisch, W Microscopy and Microan. Conf., Portland, OR, Aug., Late Breaking Poster LB15 2010.Google Scholar
[6] Jarisch, W Dohnalkova, A C Microscopy and Microanalysis Conf.. Richmond, VA July 2009.Google Scholar
[7] Biguri, A, et al, Biomedical Physics & Engineering Express 2 2016.Google Scholar