Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T13:16:59.779Z Has data issue: false hasContentIssue false
  • English
  • Français

Exploring the Limits of Focused-Probe STEM Ptychography

Published online by Cambridge University Press:  01 August 2018

P. D. Nellist ,
G. T. Martinez ,
C. O’Leary  and
L. Jones
P. D. Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Rd, OxfordUK
G. T. Martinez
Affiliation:
Department of Materials, University of Oxford, Parks Rd, OxfordUK
C. O’Leary
Affiliation:
Department of Materials, University of Oxford, Parks Rd, OxfordUK
L. Jones
Affiliation:
School of Physics, Trinity College, Dublin, Ireland

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 190 - 191
Copyright
© Microscopy Society of America 2018 

References

[1] Yang, H., et al, Nature Communications 7 2016) p. 12532.Google Scholar
[2] Ryll, H., et al, Journal of Instrumentation 11 2016) p. 04006.Google Scholar
[3] The authors acknowledge the contribution to the experimental data used below from JEOL Ltd (Y. Kondo and R. Sagawa) and PNDetector (M. Huth, M. Simson and H. Soltau). Financial support from JEOL UK Ltd and the EPSRC (grant number EP/M010708/1) is gratefully acknowledged.Google Scholar