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Exploring new frontiers with the Nion aberration-corrected STEM

Published online by Cambridge University Press:  23 November 2012

N.J. Bacon ,
G.J. Corbin ,
N. Dellby ,
P. Hrncirik ,
N. Kurz ,
T.C. Lovejoy ,
M.F. Murfitt ,
G.S. Skone ,
Z.S. Szilagyi  and
O.L. Krivanek
N.J. Bacon
Affiliation:
Nion Co., Kirkland, WA
G.J. Corbin
Affiliation:
Nion Co., Kirkland, WA
N. Dellby
Affiliation:
Nion Co., Kirkland, WA
P. Hrncirik
Affiliation:
Nion Co., Kirkland, WA
N. Kurz
Affiliation:
Nion Co., Kirkland, WA
T.C. Lovejoy
Affiliation:
Nion Co., Kirkland, WA
M.F. Murfitt
Affiliation:
Nion Co., Kirkland, WA
G.S. Skone
Affiliation:
Nion Co., Kirkland, WA
Z.S. Szilagyi
Affiliation:
Nion Co., Kirkland, WA
O.L. Krivanek
Affiliation:
Nion Co., Kirkland, WA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1278 - 1279
Copyright
Copyright © Microscopy Society of America 2012

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