Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-27T04:58:48.883Z Has data issue: false hasContentIssue false
  • English
  • Français

Exploring Differences in Amorphous Layer Formation during FIB Sample Preparation between Metals and Non Metals

Published online by Cambridge University Press:  25 July 2016

Michael Presley ,
Jacob Jensen ,
Dan Huber  and
Hamish Fraser
Michael Presley
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH
Jacob Jensen
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH
Dan Huber
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH
Hamish Fraser
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 144 - 145
Copyright
© Microscopy Society of America 2016 

References

[1] Rajsiri, S., etal, Microsc. Microanal 8(Suppl. 2 (2002) 50–51.Google Scholar
[2] Kato, N. Journal of Electron Microscopy 53 (2004) 451–458.CrossRefGoogle Scholar