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Exploration of a Butterfly Wing Using a Diverse Suite of Characterization Techniques

Published online by Cambridge University Press:  31 July 2006

V Smentkowski ,
S Ostrowski ,
E Olson ,
J Cournoyer ,
K Dovidenko  and
R Potyrailo
V Smentkowski
Affiliation:
GE Global Research Center
S Ostrowski
Affiliation:
GE Global Research Center
E Olson
Affiliation:
GE Global Research Center
J Cournoyer
Affiliation:
GE Global Research Center
K Dovidenko
Affiliation:
GE Global Research Center
R Potyrailo
Affiliation:
GE Global Research Center

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1228 - 1229
Copyright
© 2006 Microscopy Society of America