Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-04T21:10:26.864Z Has data issue: false hasContentIssue false
  • English
  • Français

Experimental Measurement of Young’s Modulus from a Single Crystalline Cementite

Published online by Cambridge University Press:  27 August 2014

Bon-Woong Koo ,
Young Jin Chang ,
Seung Pyo Hong ,
Chan Soon Kang ,
Shin Woong Jeong ,
Won-Jong Nam ,
Il-Jeong Park ,
Young-Kook Lee ,
Kyu Hwan Oh  and
Young-Woon Kim
Bon-Woong Koo
Affiliation:
Department of Materials Science and Engineering, Seoul National University, Seoul, Republic of Korea
Young Jin Chang
Affiliation:
Department of Materials Science and Engineering, Seoul National University, Seoul, Republic of Korea
Seung Pyo Hong
Affiliation:
Department of Materials Science and Engineering, Seoul National University, Seoul, Republic of Korea
Chan Soon Kang
Affiliation:
Department of Materials Science and Engineering, Seoul National University, Seoul, Republic of Korea
Shin Woong Jeong
Affiliation:
School of Advanced Materials Engineering, Kookmin University, Seoul, Republic of Korea
Won-Jong Nam
Affiliation:
School of Advanced Materials Engineering, Kookmin University, Seoul, Republic of Korea
Il-Jeong Park
Affiliation:
Department of Materials Science and Engineering, Yonsei University, Seoul, Republic of Korea
Young-Kook Lee
Affiliation:
Department of Materials Science and Engineering, Yonsei University, Seoul, Republic of Korea
Kyu Hwan Oh
Affiliation:
Department of Materials Science and Engineering, Seoul National University, Seoul, Republic of Korea
Young-Woon Kim
Affiliation:
Department of Materials Science and Engineering, Seoul National University, Seoul, Republic of Korea

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1474 - 1475
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Li, S.J., et al, Thin Solid Films 316 (1998), p.100-104.Google Scholar
[2] Mizubayashi, H., et al, Scripta Mater. 40 (1999), p.773-777.Google Scholar
[3] Kral, M.V. Mater. Charact. 45 (2000), p.105-110.Google Scholar
[4] Umemoto, M., et al, Scripta Mater. 45 (2001), p.391-397.Google Scholar
[5] Umemoto, M., et al, Metall. Mater. Trans. A 32 (2001), p. 2127-2131.Google Scholar
[6] Languillaume, J., et al, Acta Mater. 45 (1997), p.1201-1212.Google Scholar
[7] Umemoto, M., et al, Scripta Mater. 45 (2001), p.391-397.Google Scholar
[8] Li, S.J., et al, Thin Solid Films 316 (1998), p.100-104.Google Scholar
[9] Jiang, C., et al, J. Appl. Phys. 103 (2008), p.043502.Google Scholar
[10] This work has been supported by the Technology Innovation Program (10040025) funded by the Ministry of Trade, Industry, and Energy (MOTIE, Korea) and the National Research Foundation of Korea’s Nanomaterial Technology Development Program (Green Nano Technology Development Program) funded by the Ministry of Science, ICT, & Future Planning (2011-0019984).Google Scholar