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Examining Atomistic Defect-Boundary Interactions Induced by Ion Irradiation using Aberration Corrected Transmission Electron Microscopy

Published online by Cambridge University Press:  09 October 2013

J.A. Aguiar ,
M. Chi ,
P. Kotula ,
Z. Bi ,
O. Anderoglu ,
J.K. Baldwin ,
J.A. Valdez ,
A. Misra  and
B. Uberuaga
J.A. Aguiar
Affiliation:
M. Chi
Affiliation:
P. Kotula
Affiliation:
Z. Bi
Affiliation:
O. Anderoglu
Affiliation:
J.K. Baldwin
Affiliation:
J.A. Valdez
Affiliation:
A. Misra
Affiliation:
B. Uberuaga
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1982 - 1983
Copyright
Copyright © Microscopy Society of America 2013