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Examination of the Structural Quality of InAsSbBi Epilayers using Cross Section Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Rajeev R. Kosireddy ,
Stephen T. Schaefer ,
Arvind J. Shalindar ,
Preston T. Webster  and
Shane R. Johnson
Rajeev R. Kosireddy
Affiliation:
Center for Photonics Innovation & Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, AZ
Stephen T. Schaefer
Affiliation:
Center for Photonics Innovation & Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ
Arvind J. Shalindar
Affiliation:
Center for Photonics Innovation & Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ
Preston T. Webster
Affiliation:
Center for Photonics Innovation & Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ Air Force Research Laboratory, Space Vehicles Directorate RVSWS, Kirtland Air Force Base, Albuquerque, NM
Shane R. Johnson
Affiliation:
Center for Photonics Innovation & Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 36 - 37
Copyright
© Microscopy Society of America 2018 

References

[1] Webster, P. T., et al, Appl. Phys. Lett 111 2017 082104.Google Scholar
[2] The authors gratefully acknowledge financial support through the National Science Foundation (NSF) award DMR-1410393 and the Air Force Office for Scientific Research (AFOSR) STTR Phase II grant FA9550-16-C-0021, as well as the use of facilities in the LeRoy Eyring Center for Solid State Science at Arizona State University.Google Scholar