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Evidence from Simulations for Orientational Medium Range Order in Fluctuation-Electron-Microscopy Observations of a-Si

Published online by Cambridge University Press:  01 August 2004

Sanjay V. Khare ,
Serge M. Nakhmanson ,
Paul M. Voyles ,
Pawel Keblinski  and
John R. Abelson
Sanjay V. Khare
Affiliation:
University of Illinois Urbana-Champaign
Serge M. Nakhmanson
Affiliation:
North Carolina State University
Paul M. Voyles
Affiliation:
University of Wisconsin Madison
Pawel Keblinski
Affiliation:
Rensselaer Polytechnic Institute, Troy, New York
John R. Abelson
Affiliation:
University of Illinois Urbana-Champaign
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 820 - 821
Copyright
© 2004 Microscopy Society of America

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