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Evaluation of Sensitivity of Multivariate Statistical Analysis on STEM Spectrum-Imaging Datasets and its Improvement

Published online by Cambridge University Press:  27 August 2014

M. Watanabe  and
K. Ishizuka
M. Watanabe
Affiliation:
Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA 18015
K. Ishizuka
Affiliation:
HREM Research Inc., Higashimatsuyama, Saitama, 355-0055, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 112 - 113
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Pennycook, S.J., Nellist, P.D. ed. Scanning Transmission Electron Microscopy: Imaging andAnalysis, Springer, NY, (2011).Google Scholar
[2] Jolliffe, I.T. Principal Component Analysis, 2nd ed., Springer, New York (2002).Google Scholar
[3] Malinowski, E.R. Factor Analysis in Chemistry, 3rd ed., Wiley, New York (2002).Google Scholar
[4] Watanabe, M, et al., Microscopy and Analysis, 23, Issue 7 (2009), 5-7.Google Scholar
[5] Lichtert, S., Verbeeck, J. Ultramicrosc., 125 (2013), 35-42.Google Scholar
[6] Fiori, C.E., et al., NIST/NIH Desk Top Spectrum Analyzer, public domain software available from the National Institute of Standards and Technology Gaithersburg, MD.Google Scholar
[7] The author wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229.Google Scholar