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Evaluation of Optimum Instrument Conditions for the Best Spatial Resolution in Atomic-Column X-ray Analysis toward Quantification

Published online by Cambridge University Press:  30 July 2021

Masashi Watanabe
Masashi Watanabe*
Affiliation:
Lehigh University, Bethlehem, Pennsylvania, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2604 - 2606
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Sawada, H., et al. , Microsc. Miroana. 20 (2014), Suppl. 3, 124.CrossRefGoogle Scholar
Pennycook, S.J. & Nellist, P.D. ed. Scanning Transmission Electron Microscopy: Imaging and Analysis, Springer, NY, (2011).CrossRefGoogle Scholar
Watanabe, M., Microsc. Miroana. 21 (2015), Suppl. 3, 1081.CrossRefGoogle Scholar
Ishizuka, K.., J. Electron Microsc. 50 (2012), 291.CrossRefGoogle Scholar
Fiori, C.E., et al. Public domain DTSA software package (1992).Google Scholar
Williams, D.B. & Carter, C.B.. Transmission Electron Microscopy, 2nd ed. Springer, NY (2009).CrossRefGoogle Scholar
Doig, P., et al. , Philos. Mag. A, 41 (1080), 761.CrossRefGoogle Scholar
The author wishes to acknowledge financial support from the NSF through grants DMR-2018683 and CMMI-2016279.Google Scholar