Hostname: page-component-7bb8b95d7b-l4ctd Total loading time: 0 Render date: 2024-10-02T16:44:51.913Z Has data issue: false hasContentIssue false
  • English
  • Français

Evaluation of Lattice-Spacing of SiGe/Si by NBD using Two-condenser-lens TEM

Published online by Cambridge University Press:  22 July 2022

Junji Yamanaka ,
Takuya Oguni ,
Yuichi Sano ,
Yusuke Ohshima ,
Atsushi Onogawa ,
Kosuke O. Hara  and
Keisuke Arimoto
Junji Yamanaka*
Affiliation:
University of Yamanashi, Center for Inst. Analysis, Kofu, Japan
Takuya Oguni
Affiliation:
University of Yamanashi, Center for Inst. Analysis, Kofu, Japan
Yuichi Sano
Affiliation:
University of Yamanashi, Center for Inst. Analysis, Kofu, Japan
Yusuke Ohshima
Affiliation:
University of Yamanashi, Center for Cry. Sci. & Tech., Kofu, Japan
Atsushi Onogawa
Affiliation:
University of Yamanashi, Center for Cry. Sci. & Tech., Kofu, Japan
Kosuke O. Hara
Affiliation:
University of Yamanashi, Center for Cry. Sci. & Tech., Kofu, Japan
Keisuke Arimoto
Affiliation:
University of Yamanashi, Center for Cry. Sci. & Tech., Kofu, Japan
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
General Physical Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2812 - 2813
Check for updates
Copyright
Copyright © Microscopy Society of America 2022